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ITC
1998
IEEE
174views Hardware» more  ITC 1998»
15 years 10 months ago
High volume microprocessor test escapes, an analysis of defects our tests are missing
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong
VISUALIZATION
1998
IEEE
15 years 10 months ago
Building perceptual textures to visualize multidimensional datasets
This paper presents a new method for using texture to visualize multidimensional data elements arranged on an underlying threedimensional height field. We hope to use simple textu...
Christopher G. Healey, James T. Enns
SIGGRAPH
1997
ACM
15 years 10 months ago
Creating full view panoramic image mosaics and environment maps
This paper presents a novel approach to creating full view panoramic mosaics from image sequences. Unlike current panoramic stitching methods, which usually require pure horizonta...
Richard Szeliski, Heung-Yeung Shum
DIAGRAMS
2010
Springer
15 years 10 months ago
Drawing Area-Proportional Venn-3 Diagrams with Convex Polygons
Abstract. Area-proportional Venn diagrams are a popular way of visualizing the relationships between data sets, where the set intersections have a specified numerical value. In th...
Peter Rodgers, Jean Flower, Gem Stapleton, John Ho...
ICAIL
2007
ACM
15 years 10 months ago
Essential deduplication functions for transactional databases in law firms
As massive document repositories and knowledge management systems continue to expand, in proprietary environments as well as on the Web, the need for duplicate detection becomes i...
Jack G. Conrad, Edward L. Raymond