10213 search results - page 1798 / 2043 » An Experimental Analysis of Parallel |
196
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HPCA
2009
IEEE
16 years 7 months ago
2009
IEEE
The number of functional errors escaping design verification and being released into final silicon is growing, due to the increasing complexity and shrinking production schedules ...
228
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VLSID
2008
IEEE
16 years 7 months ago
2008
IEEE
Simultaneous Multi-Threading (SMT) processors are becoming popular because they exploit both instruction-level and threadlevel parallelism by issuing instructions from different t...
150
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HPCA
2008
IEEE
16 years 7 months ago
2008
IEEE
Hard-to-predict branches depending on longlatency cache-misses have been recognized as a major performance obstacle for modern microprocessors. With the widening speed gap between...
202
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HPCA
2006
IEEE
16 years 7 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
214
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PLDI
2010
ACM
16 years 4 months ago
2010
ACM
Data races indicate serious concurrency bugs such as order, atomicity, and sequential consistency violations. Races are difficult to find and fix, often manifesting only in deploy...