In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid’s...
Praveen Ghanta, Sarma B. K. Vrudhula, Rajendran Pa...
Abstract--Advances in very large-scale integration technology make clock skew more susceptible to process variations. Notwithstanding efficient exact zero-skew algorithms, clock sk...
We propose an algorithm for extracting facial features robustly from images for face recognition under large pose variation. Rectangular facial features are retrieved via the by-p...
- Dynamic power consumption in CMOS circuits is usually estimated based on the number of signal transitions. However, when considering glitches, this is not accurate because narrow...
We compare in this study two image restoration approaches for the pre-processing of printed documents: namely the Non-local Means filter and a total variation minimization approac...