In this paper, we propose a symmetrical EEG/fMRI fusion algorithm which combines EEG and fMRI by means of a common generative model. The use of a total variation (TV) prior as wel...
Martin Luessi, S. Derin Babacan, Rafael Molina, Ja...
—As transistor feature sizes continue to shrink into the sub-90nm range and beyond, the effects of process variations on critical path delay and chip yields have amplified. A com...
This paper qualitatively compares three recently proposed models for signal/image texture extraction based on total variation minimization: the Meyer [27], Vese–Osher (VO) [35],...
This paper presents a novel methodology to infer parameters of probabilistic models whose output noise is a Student-t distribution. The method is an extension of earlier work for ...
Both custom IC and FPGA designs in the nanometer regime suffer from process variations. But different from custom ICs, FPGAs' programmability offers a unique design freedom t...