2871 search results - page 196 / 575 » An Auxiliary Variational Method |
203
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ICASSP
2011
IEEE
14 years 10 months ago
2011
IEEE
Nonparametric methods are widely applicable to statistical learning problems, since they rely on a few modeling assumptions. In this context, the fresh look advocated here permeat...
187
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INFOCOM
2011
IEEE
14 years 10 months ago
2011
IEEE
Abstract – There is a growing interest in physical layer security. Recent work has demonstrated that wireless devices can generate a shared secret key by exploiting variations in...
171
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DAC
2005
ACM
16 years 7 months ago
2005
ACM
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
191
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GLVLSI
2006
IEEE
16 years 18 days ago
2006
IEEE
Process technology and environment-induced variability of gates and wires in VLSI circuits make timing analyses of such circuits a challenging task. Process variation can have a s...
185
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ICCAD
2009
IEEE
15 years 4 months ago
2009
IEEE
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...