2871 search results - page 168 / 575 » An Auxiliary Variational Method |
175
click to vote
ISCAS
2005
IEEE
16 years 3 days ago
2005
IEEE
—As process variations become a significant problem in deep sub-micron technology, a shift from deterministic static timing analysis to statistical static timing analysis for hig...
178
click to vote
SINOBIOMETRICS
2004
Springer
15 years 12 months ago
2004
Springer
Abrupt performance degradation caused by face pose variations has been one of the bottlenecks for practical face recognition applications. This paper presents a practical pose norm...
157
click to vote
FPL
2009
Springer
15 years 11 months ago
2009
Springer
A silicon Physical Unclonable Function (PUF), which is a die-unique challenge-response function, is an emerging hardware primitive for secure applications. It exploits manufacturi...
165
click to vote
ITC
1997
IEEE
15 years 10 months ago
1997
IEEE
Capacitive Leadframe testing is an effective approach for detecting faults in printed circuit boards. Capacitance measurements, however, are affected by mechanical variations duri...
158
click to vote
BMVC
2001
15 years 9 months ago
2001
This paper extends 2D Active Shape Models to 2D+time by presenting a method for modelling and segmenting spatio-temporal shapes (ST-shapes). The modelling part consists of constru...