2871 search results - page 112 / 575 » An Auxiliary Variational Method |
175
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ICPR
2004
IEEE
16 years 7 months ago
2004
IEEE
Bayesian analysis is a popular subspace based face recognition method. It casts the face recognition task into a binary classification problem with each of the two classes, intrap...
192
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VTS
2008
IEEE
16 years 24 days ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
205
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ASPDAC
2008
ACM
15 years 8 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
149
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MICRO
2003
IEEE
15 years 11 months ago
2003
IEEE
Detecting program phase changes accurately is an important aspect of dynamically adaptable systems. Three dynamic program phase detection techniques are compared – using instruc...
140
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COLING
1996
15 years 7 months ago
1996
This paper presents a practical method for a global structure analyzing Mgorithm of Japanese long sentences with lexical information, a method which we call Lexical Discourse Gram...