2451 search results - page 3 / 491 » Alternative Test Methods Using IEEE 1149.4 |
160
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DFT
2009
IEEE
16 years 16 days ago
2009
IEEE
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
153
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DATE
2005
IEEE
15 years 11 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
144
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SIBGRAPI
1999
IEEE
15 years 10 months ago
1999
IEEE
Many scientific applications use scattered data originated from samples. Interpolation techniques are necessary to estimate the values on non-sampled regions. In a previous work, t...
120
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ETS
2006
IEEE
15 years 12 months ago
2006
IEEE
Spectral analysis represents a key component in signal processing. The on-chip implementation of classical spectral estimation techniques is generally not considered as a viable B...
169
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ICITA
2005
IEEE
15 years 11 months ago
2005
IEEE
In the next generation Internet, the network should not only be considered as a communication medium, but also as an endless source of services available to the end-systems. These...