Sciweavers

8903 search results - page 1555 / 1781
» Alternative
Sort
View
IV
2003
IEEE
201views Visualization» more  IV 2003»
15 years 12 months ago
Layout Metrics for Euler Diagrams
An alternative term for these diagrams is “Euler-Venn diagrams” but they are often inaccurately called “Venn diagrams”. Venn diagrams often look similar, but must contain a...
Jean Flower, Peter Rodgers, Paul Mutton
IV
2003
IEEE
200views Visualization» more  IV 2003»
15 years 12 months ago
Artist As Researcher, Understanding The Tools
The paper begins with a response to the nature of contemporary artists relationships to how computers have permeated the fine art domain and how they affect the creative process. ...
Theresa Gartland-Jones
KBSE
2003
IEEE
15 years 12 months ago
Tool-Assisted Unit Test Selection Based on Operational Violations
Unit testing, a common step in software development, presents a challenge. When produced manually, unit test suites are often insufficient to identify defects. The main alternativ...
Tao Xie, David Notkin
LCN
2003
IEEE
15 years 12 months ago
Improving the Aggregate Throughput of Access Points in IEEE 802.11 Wireless LANs
In IEEE 802.11 wireless LANs, the DCF access method and the PCF access method operate alternatively within a superframe to service the time-varying traffic demands. Due to differ...
X. James Dong, Mustafa Ergen, Pravin Varaiya, Anuj...
MICRO
2003
IEEE
109views Hardware» more  MICRO 2003»
15 years 12 months ago
TLC: Transmission Line Caches
It is widely accepted that the disproportionate scaling of transistor and conventional on-chip interconnect performance presents a major barrier to future high performance systems...
Bradford M. Beckmann, David A. Wood
« Prev « First page 1555 / 1781 Last » Next »