As integrated circuits manufacturing technology is advancing into 65nm and 45nm nodes, extensive resolution enhancement techniques (RETs) are needed to correctly manufacture a chip...
Liang Deng, Martin D. F. Wong, Kai-Yuan Chao, Hua ...
Nanometer CMOS scaling has resulted in greatly increased circuit variability, with extremely adverse consequences on design predictability and yield. A number of recent works have...
Ashoka Visweswara Sathanur, Antonio Pullini, Luca ...
Document representations can rapidly become unwieldy if they try to encapsulate all possible document properties, ranging tract structure to detailed rendering and layout. We pres...
Inferring the subjective perception of a video stream in real time continues to be a stiff problem. This article presents MintMOS: a lightweight, no-reference, loadable kernel mod...
Sources of data uncertainty and imprecision are numerous. A way to handle this uncertainty is to associate probabilistic annotations to data. Many such probabilistic database mode...