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DFT
2008
IEEE
117views VLSI» more  DFT 2008»
16 years 1 months ago
Impact of Technology and Voltage Scaling on the Soft Error Susceptibility in Nanoscale CMOS
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
Vikas Chandra, Robert C. Aitken
ISQED
2008
IEEE
154views Hardware» more  ISQED 2008»
16 years 1 months ago
Error Protected Data Bus Inversion Using Standard DRAM Components
Off-chip communication consumes a significant part of main memory system power. Existing solutions imply the use of specialized memories or assume error free environments. This i...
Maurizio Skerlj, Paolo Ienne
PIMRC
2008
IEEE
16 years 1 months ago
Dynamic data aggregation and transport in wireless sensor networks
—In wireless sensor networks, in-network aggregation is the process of compressing locally the data gathered by the sensor nodes, so that only the compressed data travel across s...
Mario O. Diaz, Kin K. Leung
DATE
2007
IEEE
92views Hardware» more  DATE 2007»
16 years 1 months ago
Dynamic power management under uncertain information
This paper tackles the problem of dynamic power management (DPM) in nanoscale CMOS design technologies that are typically affected by increasing levels of process, voltage, and te...
Hwisung Jung, Massoud Pedram
ICC
2007
IEEE
269views Communications» more  ICC 2007»
16 years 1 months ago
A Routing-Driven Key Management Scheme for Heterogeneous Sensor Networks
–The many-to-one traffic pattern dominates in sensor networks, where a large number of sensor nodes send data to one sink. A sensor node may only communicate with a small portion...
Xiaojiang Du, Yang Xiao, Song Ci, Mohsen Guizani, ...