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DFT
2008
IEEE
138views VLSI» more  DFT 2008»
16 years 1 months ago
Exploring Density-Reliability Tradeoffs on Nanoscale Substrates: When do smaller less reliable devices make sense?
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
Andrey V. Zykov, Gustavo de Veciana
VL
2008
IEEE
115views Visual Languages» more  VL 2008»
16 years 1 months ago
Flexible visualization of automatic simulation based on structured graph transformation
Visual modeling languages for discrete behavior modeling allow the modeler to describe how systems develop over time during system runs. Models of these languages are the basis fo...
Enrico Biermann, Claudia Ermel, Jonas Hurrelmann, ...
DSN
2007
IEEE
16 years 1 months ago
Architecture-Level Soft Error Analysis: Examining the Limits of Common Assumptions
This paper concerns the validity of a widely used method for estimating the architecture-level mean time to failure (MTTF) due to soft errors. The method first calculates the fai...
Xiaodong Li, Sarita V. Adve, Pradip Bose, Jude A. ...
HPDC
2007
IEEE
16 years 1 months ago
Ridge: combining reliability and performance in open grid platforms
Large-scale donation-based distributed infrastructures need to cope with the inherent unreliability of participant nodes. A widely-used work scheduling technique in such environme...
Krishnaveni Budati, Jason D. Sonnek, Abhishek Chan...
SASO
2007
IEEE
16 years 29 days ago
Leveraging Resource Prediction for Anticipatory Dynamic Configuration
Self-adapting systems based on multiple concurrent applications must decide how to allocate scarce resources to applications and how to set the quality parameters of each applicat...
Vahe Poladian, David Garlan, Mary Shaw, M. Satyana...