7253 search results - page 322 / 1451 » Agile Performance Testing |
162
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CEC
2009
IEEE
15 years 11 months ago
2009
IEEE
— Many real-world dynamic optimisation problems have constraints, and in certain cases not only the objective function changes over time, but the constraints also change as well....
236
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VTS
2000
IEEE
15 years 11 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
152
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ITC
1996
IEEE
15 years 11 months ago
1996
IEEE
Orthogonal scan paths, which follow the path of the data flow, can be used in data path designs to reduce the test overhead -- area, delay and test application time -- by sharing ...
157
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GECCO
2006
Springer
15 years 10 months ago
2006
Springer
In this paper we compare Mixed-Integer Evolution Strategies (MI-ES) and standard Evolution Strategies (ES) when applied to find optimal solutions for artificial test problems and ...
142
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ASPDAC
2001
ACM
15 years 10 months ago
2001
ACM
Abstract-- We propose a method of correlating circuit performance with technology fluctuations during the circuit-design phase. The method employs test circuits sensitive for techn...