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SAC
2008
ACM
15 years 6 months ago
Automatic software fault localization using generic program invariants
Despite extensive testing in the development phase, residual defects can be a great threat to dependability in the operational phase. This paper studies the utility of lowcost, ge...
Rui Abreu, Alberto González 0002, Peter Zoe...
JMLR
2010
101views more  JMLR 2010»
15 years 1 months ago
Efficient Reductions for Imitation Learning
Imitation Learning, while applied successfully on many large real-world problems, is typically addressed as a standard supervised learning problem, where it is assumed the trainin...
Stéphane Ross, Drew Bagnell
DAC
2011
ACM
14 years 6 months ago
Characterizing within-die and die-to-die delay variations introduced by process variations and SOI history effect
Variations in delay caused by within-die and die-to-die process variations and SOI history effect increase timing margins and reduce performance. In order to develop mitigation te...
Jim Aarestad, Charles Lamech, Jim Plusquellic, Dhr...
SIGMOD
2007
ACM
186views Database» more  SIGMOD 2007»
16 years 6 months ago
Fg-index: towards verification-free query processing on graph databases
Graphs are prevalently used to model the relationships between objects in various domains. With the increasing usage of graph databases, it has become more and more demanding to e...
James Cheng, Yiping Ke, Wilfred Ng, An Lu
PR
2010
126views more  PR 2010»
15 years 5 months ago
Discriminability and reliability indexes: Two new measures to enhance multi-image face recognition
In order to handle complex face image variations in face recognition, multi-image face recognition has been proposed, instead of using a single still-imagebased approach. In many ...
Weiwen Zou, Pong C. Yuen