7253 search results - page 281 / 1451 » Agile Performance Testing |
171
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VTS
2007
IEEE
16 years 28 days ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
178
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CLEF
2007
Springer
16 years 25 days ago
2007
Springer
The domain-specific track uses test collections from the social science domain to test monolingual and cross-language retrieval in structured bibliographic databases. Special atte...
147
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ACSAC
2006
IEEE
16 years 22 days ago
2006
IEEE
The Multimedia Messaging Service (MMS) is becoming more popular, as mobile phones integrate audio and video recording functionality. Multimedia messages are delivered to users thr...
149
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CSB
2005
IEEE
16 years 8 days ago
2005
IEEE
Raising seeds for biological experiments is prone to error; a careful experimenter will test in the lab to verify that plants are of the intended strain. Choosing a minimal set of...
148
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...