7253 search results - page 270 / 1451 » Agile Performance Testing |
146
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VTS
2003
IEEE
15 years 12 months ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
207
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DAC
2003
ACM
15 years 12 months ago
2003
ACM
We present a novel method to efficiently generate, compress and apply test patterns in a logic BIST architecture. Patterns are generated by a modified automatic test pattern gener...
183
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DATE
2000
IEEE
15 years 11 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
161
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IV
1999
IEEE
15 years 11 months ago
1999
IEEE
The aim of occlusion culling is to cull away a significant amount of invisible primitives at different viewpoints. We present two algorithms to improve occlusion culling for a hig...
170
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VTS
1995
IEEE
15 years 10 months ago
1995
IEEE
This paper presents a new approach for on-chip test pattern generation. The set of test patterns generated by a pseudo-random pattern generator (e.g., an LFSR) is transformed into...