7253 search results - page 255 / 1451 » Agile Performance Testing |
174
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ICCAD
1996
IEEE
15 years 10 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...
180
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CEC
2009
IEEE
15 years 11 months ago
2009
IEEE
Abstract— We propose an asynchronous island-model algorithm distribution framework and test the popular Differential Evolution algorithm performance when a few processors are ava...
148
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ICASSP
2011
IEEE
14 years 10 months ago
2011
IEEE
We introduce a novel statistical test for unsupervised detection of changepoints in multidimensional sequences of temporal observations. The test statistic is based on a multivari...
185
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FM
2006
Springer
15 years 10 months ago
2006
Springer
Non-determinism of the thread schedule is a well-known problem in concurrent programming. However, other sources of non-determinism exist which cannot be controlled by an applicati...
171
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
1 The term "functional BIST" describes a test method to control functional modules so that they generate a deterministic test set, which targets structural faults within ...