7253 search results - page 254 / 1451 » Agile Performance Testing |
186
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VLSID
2001
IEEE
16 years 7 months ago
2001
IEEE
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
115
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DATE
2009
IEEE
16 years 1 months ago
2009
IEEE
— This paper proposes a novel self-healing methodology for embedded RF Amplifiers (LNAs) in RF sub-systems. The proposed methodology is based on oscillation principles in which t...
155
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FCCM
2007
IEEE
16 years 29 days ago
2007
IEEE
This paper provides an evaluation of SGI® RASC™ RC100 technology from a computational science software developer’s perspective. A brute force implementation of a two-point an...
140
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DATE
2006
IEEE
16 years 21 days ago
2006
IEEE
The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault d...
154
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ITC
2003
IEEE
15 years 12 months ago
2003
IEEE
–This paper provides proof of concept for the newly-approved 1149.6 standard by investigating the first silicon implementation of the test receiver. EXTEST and EXTEST_PULSE tests...