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DT
2006
109views more  DT 2006»
15 years 6 months ago
Test Consideration for Nanometer-Scale CMOS Circuits
The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng
TIP
2008
142views more  TIP 2008»
15 years 6 months ago
Image Feature Localization by Multiple Hypothesis Testing of Gabor Features
Several novel and particularly successful object and object category detection and recognition methods based on image features, local descriptions of object appearance, have recent...
Jarmo Ilonen, Joni-Kristian Kamarainen, Pekka Paal...
ICML
2003
IEEE
16 years 7 months ago
Testing Exchangeability On-Line
The majority of theoretical work in machine learning is done under the assumption of exchangeability: essentially, it is assumed that the examples are generated from the same prob...
Vladimir Vovk, Ilia Nouretdinov, Alexander Gammerm...
CHI
2006
ACM
16 years 7 months ago
Reality testing: HCI challenges in non-traditional environments
Non-traditional environments often change rapidly without forewarning, are difficult or impossible to control, and have other environmental and operational constraints that cannot...
Gisele Bennett, Gitte Lindgaard, Bruce Tsuji, Kay ...
GLOBECOM
2008
IEEE
16 years 29 days ago
Non-Coherent Amplify-and-Forward Generalized Likelihood Ratio Test Receiver
Abstract—This paper proposes a simple non-coherent amplifyand-forward receiver for the relay channel and evaluates its diversity performance for Rayleigh fading channels. We use ...
Michael R. Souryal