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ICDM
2002
IEEE
133views Data Mining» more  ICDM 2002»
15 years 11 months ago
Estimating the number of segments in time series data using permutation tests
Segmentation is a popular technique for discovering structure in time series data. We address the largely open problem of estimating the number of segments that can be reliably di...
Kari Vasko, Hannu Toivonen
VTS
2002
IEEE
113views Hardware» more  VTS 2002»
15 years 11 months ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
EURODAC
1994
IEEE
130views VHDL» more  EURODAC 1994»
15 years 10 months ago
RESIST: a recursive test pattern generation algorithm for path delay faults
This paper presents Resist, a recursive test pattern generation (TPG) algorithm for path delay fault testing of scan-based circuits. In contrast to other approaches, it exploits t...
Karl Fuchs, Michael Pabst, Torsten Rössel
LREC
2010
192views Education» more  LREC 2010»
15 years 8 months ago
Testing Semantic Similarity Measures for Extracting Synonyms from a Corpus
The definition of lexical semantic similarity measures has been the subject of lots of works for many years. In this article, we focus more specifically on distributional semantic...
Olivier Ferret
WSC
2004
15 years 7 months ago
Fast Model-Based Penetration Testing
Traditional approaches to security evaluation have been based on penetration testing of real systems, or analysis of formal models of such systems. The former suffer from the prob...
Sankalp Singh, James Lyons, David M. Nicol