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DAC
1994
ACM
15 years 10 months ago
Clock Grouping: A Low Cost DFT Methodology for Delay Testing
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...
Wen-Chang Fang, Sandeep K. Gupta
ITC
1995
IEEE
122views Hardware» more  ITC 1995»
15 years 10 months ago
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
Stefan Weiner
CCS
2010
ACM
15 years 9 months ago
RunTest: assuring integrity of dataflow processing in cloud computing infrastructures
Cloud computing has emerged as a multi-tenant resource sharing platform, which allows different service providers to deliver software as services in an economical way. However, fo...
Juan Du, Wei Wei, Xiaohui Gu, Ting Yu
LREC
2008
101views Education» more  LREC 2008»
15 years 8 months ago
Test Collections for Spoken Document Retrieval from Lecture Audio Data
The Spoken Document Processing Working Group, which is part of the special interest group of spoken language processing of the Information Processing Society of Japan, is developi...
Tomoyosi Akiba, Kiyoaki Aikawa, Yoshiaki Itoh, Tat...
AAAI
1994
15 years 7 months ago
CHATTERBOTS, TINYMUDS, and the Turing Test: Entering the Loebner Prize Competition
The Turing Test was proposed by Alan Turing in 1950; he called it the Imitation Game. In 1991 Hu Loebner prize competition, offering a f h Loebner started the 100,000 prize to the...
Michael L. Mauldin