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ICCAD
2010
IEEE
133views Hardware» more  ICCAD 2010»
15 years 3 months ago
Testing methods for detecting stuck-open power switches in coarse-grain MTCMOS designs
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
Szu-Pang Mu, Yi-Ming Wang, Hao-Yu Yang, Mango Chia...
IAJIT
2010
147views more  IAJIT 2010»
15 years 3 months ago
A novel radon-wavelet based OFDM system design and performance under different channel conditions
: Finite Radon Transform mapper has the ability to increase orthogonality of sub-carriers, it is non sensitive to channel parameters variations, and has a small constellation energ...
Abbas Hasan Kattoush
CHI
2006
ACM
16 years 6 months ago
Design and experimental analysis of continuous location tracking techniques for Wizard of Oz testing
Wizard of Oz (WOz) testing has shown promise as an effective way to test location-enhanced applications. However, it is challenging to conduct a location-based WOz test because of...
Yang Li, Evan Welbourne, James A. Landay
ICCAD
2008
IEEE
98views Hardware» more  ICCAD 2008»
16 years 3 months ago
Statistical path selection for at-speed test
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chan...
ICST
2009
IEEE
16 years 1 months ago
Test Input Generation Using UML Sequence and State Machines Models
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...
Aritra Bandyopadhyay, Sudipto Ghosh