7253 search results - page 163 / 1451 » Agile Performance Testing |
209
click to vote
SBCCI
2005
ACM
16 years 1 days ago
2005
ACM
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
200
click to vote
ISQED
2002
IEEE
15 years 11 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
174
click to vote
ICSE
1999
IEEE-ACM
15 years 10 months ago
1999
IEEE-ACM
Structural coverage criteria are often used as an indicator of the thoroughness of testing, but complete satisfaction of a criterion is seldom achieved. When a software product is...
152
click to vote
DELTA
2004
IEEE
15 years 10 months ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
155
click to vote
ITC
1991
IEEE
15 years 10 months ago
1991
IEEE
Two approaches have been used to balance the cost of generating e ective tests for ICs and the need to increase the ICs' quality level. The rst approach favorsusing high-leve...