7253 search results - page 136 / 1451 » Agile Performance Testing |
100
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DATE
2007
IEEE
16 years 23 days ago
2007
IEEE
∗ This paper presents an analysis of the electrical origins of Slow Write Driver Faults (SWDFs) [1] that may affect SRAM write drivers in 65nm technology. This type of fault is t...
126
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ICRA
2006
IEEE
16 years 14 days ago
2006
IEEE
Today’s aerial robots are being tasked to fly in nearEarth environments such as caves, forests and buildings. The lack of flight data and performance metrics poses a gap that ...
160
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DATE
2005
IEEE
16 years 1 days ago
2005
IEEE
This paper describes two research projects that develop new low-cost techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals. Each project uses commercially ...
179
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ISSRE
2005
IEEE
16 years 18 hour ago
2005
IEEE
The eXtensible Markup Language (XML) is widely used to transmit data across the Internet. XML schemas are used to define the syntax of XML messages. XML-based applications can re...
154
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DAC
2004
ACM
15 years 12 months ago
2004
ACM
In order to improve the testabilities and power consumption, a new state assignment technique based on m-block partition is introduced in this paper. The length and number of feed...