7253 search results - page 133 / 1451 » Agile Performance Testing |
144
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DDECS
2006
IEEE
16 years 15 days ago
2006
IEEE
: An embedded rectifier-based Built-In-Test (BIT) detection circuit for the RF integrated circuits is proposed in this work, and charge pump rectifier is adopted to transform the R...
170
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IPPS
2006
IEEE
16 years 14 days ago
2006
IEEE
In building a real-life mobile ad-hoc network (MANET), network emulation has been appraised as an efficient approach for testing the real implementations of routing algorithms and...
171
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ISVLSI
2003
IEEE
15 years 11 months ago
2003
IEEE
This paper describes a technique for re-ordering of scan cells to minimize power dissipation that is also capable of reducing the area overhead of the circuit compared to a random...
155
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MTDT
2003
IEEE
15 years 11 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
155
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ITC
2002
IEEE
15 years 11 months ago
2002
IEEE
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacit...