7253 search results - page 130 / 1451 » Agile Performance Testing |
138
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HT
2004
ACM
15 years 12 months ago
2004
ACM
The SMIL 2.0 Language profile support several mechanisms for controlling interactivity in a SMIL 2.0 presentation. Unfortunately, the SMIL standard testset does not verify complex...
172
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ICCD
2003
IEEE
15 years 11 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
123
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ITC
2000
IEEE
15 years 10 months ago
2000
IEEE
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
145
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ITC
1998
IEEE
15 years 10 months ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
180
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EURODAC
1990
IEEE
15 years 10 months ago
1990
IEEE
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...