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VTS
1997
IEEE
90views Hardware» more  VTS 1997»
15 years 10 months ago
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
Jonathan T.-Y. Chang, Edward J. McCluskey
EVOW
2008
Springer
15 years 8 months ago
An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
Danilo Ravotto, Ernesto Sánchez, Massimilia...
CLIN
2001
15 years 7 months ago
Creating a Dutch Information Retrieval Test Corpus
This paper describes the first large-scale evaluation of information retrieval systems using Dutch documents and queries. We describe in detail the characteristics of the Dutch te...
Djoerd Hiemstra, David van Leeuwen
GECCO
2008
Springer
112views Optimization» more  GECCO 2008»
15 years 7 months ago
Handling dynamic data structures in search based testing
There has been little attention to search based test data generation in the presence of pointer inputs and dynamic data structures, an area in which recent concolic methods have e...
Kiran Lakhotia, Mark Harman, Phil McMinn
CSDA
2007
159views more  CSDA 2007»
15 years 6 months ago
Multivariate out-of-sample tests for Granger causality
A time series is said to Granger cause another series if it has incremental predictive power when forecasting it. While Granger causality tests have been studied extensively in th...
Sarah Gelper, Christophe Croux