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SAFECOMP
2007
Springer
16 years 16 days ago
Improving Test Coverage for UML State Machines Using Transition Instrumentation
We discuss the problem of generating test suites from UML state machines and present a method to extend the capabilities of existing automated test case generators. Current tools p...
Mario Friske, Bernd-Holger Schlingloff
SERA
2007
Springer
16 years 16 days ago
A Formal Approach to Test the Robustness of Embedded Systems using Behaviour Analysis
Robustness is an important feature required for embedded systems. This paper presents a methodology to test robustness of such systems. We investigate system behaviour aspects. We...
Antoine Rollet, Fares Saad-Khorchef
ICCAD
1998
IEEE
122views Hardware» more  ICCAD 1998»
15 years 10 months ago
Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
Vamsi Boppana, W. Kent Fuchs
HASE
2007
IEEE
15 years 10 months ago
Model Validation using Automatically Generated Requirements-Based Tests
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
DATE
2004
IEEE
120views Hardware» more  DATE 2004»
15 years 10 months ago
Testing Logic Cores using a BIST P1500 Compliant Approach: A Case of Study
In this paper we describe how we applied a BIST-based approach to the test of a logic core to be included in System-on-achip (SoC) environments. The approach advantages are the ab...
Paolo Bernardi, Guido Masera, Federico Quaglio, Ma...