7253 search results - page 117 / 1451 » Agile Performance Testing |
158
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ISBI
2008
IEEE
16 years 7 months ago
2008
IEEE
We consider the problem of sequential hypothesis testing when the exact pdfs are not known but instead a set of iid samples are used to describe the hypotheses. We modify the clas...
156
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ATS
2005
IEEE
16 years 1 days ago
2005
IEEE
In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
157
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CEC
2005
IEEE
16 years 1 days ago
2005
IEEE
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
192
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EVOW
2004
Springer
15 years 11 months ago
2004
Springer
Abstract. Dynamic optimization using evolutionary algorithms is receiving increasing interests. However, typical test functions for comparing the performance of various dynamic opt...
143
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DATE
2003
IEEE
15 years 11 months ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...