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DATE
2005
IEEE
99views Hardware» more  DATE 2005»
16 years 19 hour ago
Worst-Case and Average-Case Analysis of n-Detection Test Sets
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
Irith Pomeranz, Sudhakar M. Reddy
HICSS
2003
IEEE
179views Biometrics» more  HICSS 2003»
15 years 11 months ago
JUMBL: A Tool for Model-Based Statistical Testing
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
Stacy J. Prowell
ITC
2003
IEEE
97views Hardware» more  ITC 2003»
15 years 11 months ago
A Generic Test Path and DUT Model for DataCom ATE
– It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. Fo...
Jie Sun, Mike Li
DFT
2002
IEEE
128views VLSI» more  DFT 2002»
15 years 11 months ago
Matrix-Based Test Vector Decompression Using an Embedded Processor
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
Kedarnath J. Balakrishnan, Nur A. Touba
FMCO
2006
Springer
123views Formal Methods» more  FMCO 2006»
15 years 10 months ago
Exhaustive Testing of Exception Handlers with Enforcer
Testing application behavior in the presence of I/O failures is extremely difficult. The resources used for testing usually work without failure. Failures typically cannot be initi...
Cyrille Artho, Armin Biere, Shinichi Honiden