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EDM
2008
127views Data Mining» more  EDM 2008»
15 years 7 months ago
Adaptive Test Design with a Naive Bayes Framework
Bayesian graphical models are commonly used to build student models from data. A number of standard algorithms are available to train Bayesian models from student skills assessment...
Michel C. Desmarais, Alejandro Villarreal, Michel ...
ISM
2006
IEEE
163views Multimedia» more  ISM 2006»
16 years 12 days ago
Digital Camera Resolution: An Improved Heisenberg-Gabor Testing Method
The paper demonstrates a method of simultaneously testing the spatial and tonal resolution of a camera. Unlike the modulation transfer function which has been used in the past, th...
Corey Manders, Steve Mann
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
16 years 15 hour ago
An Infrastructure to Functionally Test Designs Generated by Compilers Targeting FPGAs
This paper presents an infrastructure to test the functionality of the specific architectures output by a highlevel compiler targeting dynamically reconfigurable hardware. It resu...
Rui Rodrigues, João M. P. Cardoso
IJCNN
2000
IEEE
15 years 10 months ago
Non-Destructive Test by the Hopfield Network
The aim of this work is to propose and discuss a technique which allows for classifying the defects found in metallic components on the basis of a non-destructive Remote-Field Edd...
S. Barcherini, L. Cipiccia, M. Maggi, Simone Fiori...
IPCV
2008
15 years 7 months ago
Test and Measure of Circularity for Digital Curves
We propose one geometric algorithm to solve both the problem of circularity test and the problem of circularity measure. The former problem consists in deciding whether a given di...
Tristan Roussillon, Isabelle Sivignon, Laure Tougn...