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VTS
1999
IEEE
66views Hardware» more  VTS 1999»
15 years 10 months ago
A New Bare Die Test Methodology
1 While multichip module technology has been developed for high performance IC applications, the technology is not widely adopted due to economical reasons. One of the reasons that...
Zao Yang, K.-T. Cheng, K. L. Tai
GPC
2008
Springer
15 years 7 months ago
An Automatic and Scalable Testing Tool for Workflow Systems
Nowadays workflow systems are widely deployed around the world, especially within large international corporations. Thus the performance evaluation of these workflow systems becom...
Lin Quan, Xiaozhu Lin, Jianmin Wang
ICML
2007
IEEE
16 years 7 months ago
Asymptotic Bayesian generalization error when training and test distributions are different
In supervised learning, we commonly assume that training and test data are sampled from the same distribution. However, this assumption can be violated in practice and then standa...
Keisuke Yamazaki, Klaus-Robert Müller, Masash...
ICAC
2009
IEEE
16 years 1 months ago
Run-time correlation engine for system monitoring and testing
We present an approach and implementation for run-time correlation of large volumes of log data and symptom matching of know issues in the context of large enterprise applications...
Viliam Holub, Trevor Parsons, Patrick O'Sullivan, ...
ICASSP
2009
IEEE
16 years 1 months ago
Rate-constrained distributed distance testing and its applications
We investigate a practical approach to solving one instantiation of a distributed hypothesis testing problem under severe rate constraints that shows up in a wide variety of appli...
Chuohao Yeo, Parvez Ahammad, Hao Zhang, Kannan Ram...