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VLSID
2008
IEEE
122views VLSI» more  VLSID 2008»
16 years 23 days ago
Testing Flash Memories for Tunnel Oxide Defects
— Testing non volatile memories for tunnel oxide defects is one of the most important aspects to guarantee cell reliability. Defective tunnel oxide layer in core memory cells can...
Mohammad Gh. Mohammad, Kewal K. Saluja
DATE
2007
IEEE
102views Hardware» more  DATE 2007»
16 years 22 days ago
A two-tone test method for continuous-time adaptive equalizers
This paper describes a novel test method for continuous-time adaptive equalizers. This technique applies a two-sinusoidal-tone signal as stimulus and includes an RMS detector for ...
Dongwoo Hong, Shadi Saberi, Kwang-Ting Cheng, C. P...
ISSRE
2006
IEEE
16 years 12 days ago
Testing During Refactoring: Adding Aspects to Legacy Systems
Moving program code that implements cross-cutting concerns into aspects can improve the maintainability of legacy systems. This kind of refactoring, called aspectualization, can a...
Michael Mortensen, Sudipto Ghosh, James M. Bieman
TAICPART
2010
IEEE
166views Education» more  TAICPART 2010»
15 years 4 months ago
Linguistic Security Testing for Text Communication Protocols
We introduce a new Syntax-based Security Testing (SST) framework that uses a protocol specification to perform security testing on text-based communication protocols. A protocol sp...
Ben W. Y. Kam, Thomas R. Dean
MA
2011
Springer
285views Communications» more  MA 2011»
15 years 1 months ago
Dual divergence estimators and tests: Robustness results
The class of dual φ-divergence estimators (introduced in Broniatowski and Keziou (2009) [6]) is explored with respect to robustness through the influence function approach. For ...
Aida Toma, Michel Broniatowski