7253 search results - page 105 / 1451 » Agile Performance Testing |
163
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ITC
1993
IEEE
15 years 10 months ago
1993
IEEE
Built-In-Self-Test BIST for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means ...
180
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ICASSP
2011
IEEE
14 years 10 months ago
2011
IEEE
This paper links two a priori different topics, group testing and traitor tracing. Group testing, as an instantiation of a compressed sensing problem over binary data, is indeed e...
147
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ICSM
2009
IEEE
16 years 1 months ago
2009
IEEE
Many software systems rely on third-party components during their build process. Because the components are constantly evolving, quality assurance demands that developers perform ...
155
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GECCO
2007
Springer
16 years 16 days ago
2007
Springer
The diffusion of service oriented architectures introduces the need for novel testing approaches. On the one side, testing must be able to identify failures in the functionality ...
151
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ICASSP
2008
IEEE
16 years 25 days ago
2008
IEEE
Relying on optimally distinguishable distributions (ODD), it was defined very recently a new framework for the composite hypothesis testing. We resort to the linear model to inve...