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DAC
2003
ACM
16 years 7 months ago
Test cost reduction for SOCs using virtual TAMs and lagrange multipliers
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
Anuja Sehgal, Vikram Iyengar, Mark D. Krasniewski,...
MICCAI
2007
Springer
16 years 7 months ago
High Throughput Analysis of Breast Cancer Specimens on the Grid
Breast cancer accounts for about 30% of all cancers and 15% of all cancer deaths in women in the United States. Advances in computer assisted diagnosis (CAD) holds promise for earl...
Lin Yang, Wenjin Chen, Peter Meer, Gratian Salaru,...
MICCAI
2005
Springer
16 years 7 months ago
Accurate Image Registration for Quadrature Tomographic Microscopy
Abstract. This paper presents a robust and fully automated registration algorithm for registration of images of Quadrature Tomographic Microscopy (QTM), which is an optical interfe...
Chia-Ling Tsai, William Warger, Charles DiMarzio
SIGSOFT
2007
ACM
16 years 7 months ago
Differential testing: a new approach to change detection
Regression testing, as it's commonly practiced, is unsound due to inconsistent test repair and test addition. This paper presents a new technique, differential testing, that ...
Robert B. Evans, Alberto Savoia
SIGSOFT
2004
ACM
16 years 7 months ago
Implementing protocols via declarative event patterns
This paper introduces declarative event patterns (DEPs) as a means to implement protocols while improving their traceability, comprehensibility, and maintainability. DEPs are desc...
Robert J. Walker, Kevin Viggers