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156
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DATE
2002
IEEE
15 years 12 months ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
184
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IOLTS
2002
IEEE
15 years 11 months ago
2002
IEEE
The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
175
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KBSE
2002
IEEE
15 years 11 months ago
2002
IEEE
Generating test inputs for a path in a function with integer and real parameters is an important but difficult problem. The problem becomes more difficult when pointers are pass...
139
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WABI
2001
Springer
15 years 11 months ago
2001
Springer
There are very few instances in which positive Darwinian selection has been convincingly demonstrated at the molecular level. In this study, we present a novel test for detecting p...
179
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ATS
2000
IEEE
15 years 11 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...