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AICT
2006
IEEE
102views Communications» more  AICT 2006»
16 years 29 days ago
A Computer Aided Grading System for Subjective Tests
Computer aided tests replace traditional written answers on paper sheets with electronic records. For subjective tests, computers are not able to do all grading jobs, due to limit...
Yijian Wu, Wenyun Zhao, Xin Peng, Yunjiao Xue
CSMR
2006
IEEE
16 years 29 days ago
Object-Oriented Legacy System Trace-based Logic Testing
When reengineering legacy systems, it is crucial to assess if the legacy behavior has been preserved or how it changed due to the reengineering effort. Ideally if a legacy system ...
Stéphane Ducasse, Tudor Gîrba, Roel W...
ICCD
2006
IEEE
105views Hardware» more  ICCD 2006»
16 years 28 days ago
A New Class of Sequential Circuits with Acyclic Test Generation Complexity
—This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose t...
Chia Yee Ooi, Hideo Fujiwara
VLSID
2006
IEEE
94views VLSI» more  VLSID 2006»
16 years 27 days ago
On the Size and Generation of Minimal N-Detection Tests
The main result of this paper, proved as a theorem, is that a lower bound on the number of test vectors that detect each fault at least N times is N
Kalyana R. Kantipudi
SIGSOFT
2006
ACM
16 years 25 days ago
Detecting increases in feature coupling using regression tests
Repeated changes to a software system can introduce small weaknesses such as unplanned dependencies between different parts of the system. While such problems usually go undetecte...
Olivier Giroux, Martin P. Robillard