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ICCAD
2008
IEEE
98views Hardware» more  ICCAD 2008»
16 years 3 months ago
Statistical path selection for at-speed test
Abstract— Process variations make at-speed testing significantly more difficult. They cause subtle delay changes that are distributed rather than the localized nature of a trad...
Vladimir Zolotov, Jinjun Xiong, Hanif Fatemi, Chan...
DATE
2009
IEEE
93views Hardware» more  DATE 2009»
16 years 1 months ago
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
Abstract—Multiple-voltage is an effective dynamic power reduction design technique. Recent research has shown that testing for resistive bridging faults in such designs requires ...
S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Ha...
ICSM
2009
IEEE
16 years 1 months ago
Prioritizing component compatibility tests via user preferences
Many software systems rely on third-party components during their build process. Because the components are constantly evolving, quality assurance demands that developers perform ...
Il-Chul Yoon, Alan Sussman, Atif M. Memon, Adam A....
ICST
2009
IEEE
16 years 1 months ago
Test Input Generation Using UML Sequence and State Machines Models
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...
Aritra Bandyopadhyay, Sudipto Ghosh
CDC
2008
IEEE
131views Control Systems» more  CDC 2008»
16 years 1 months ago
Probabilistic testing for stochastic hybrid systems
— In this paper we propose a testing based method for safety/ reachability analysis of stochastic hybrid systems. Testing based methods are characterized by analysis based on the...
A. Agung Julius, George J. Pappas