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ET
2000
145views more  ET 2000»
15 years 6 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar
INFORMATICALT
2000
125views more  INFORMATICALT 2000»
15 years 6 months ago
An Algorithm for Construction of Test Cases for the Quadratic Assignment Problem
In this paper we present an algorithm for generating quadratic assignment problem (QAP) instances with known provably optimal solution. The flow matrix of such instances is constru...
Gintaras Palubeckis
ET
2002
97views more  ET 2002»
15 years 6 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer
TCAD
2002
106views more  TCAD 2002»
15 years 6 months ago
Design of hierarchical cellular automata for on-chip test pattern generator
This paper introduces the concept of hierarchical cellular automata (HCA). The theory of HCA is developed over the Galois extension field (2 ), where each cell of the CA can store ...
Biplab K. Sikdar, Niloy Ganguly, Parimal Pal Chaud...
MR
2007
66views Robotics» more  MR 2007»
15 years 6 months ago
Test structures for dielectric spectroscopy of thin films at microwave frequencies
This work describes the application of two different test structures to execute broadband microwave measurements of the dielectric constant of ceramic thin films. Coplanar wavegui...
Nicola Delmonte, B. E. Watts, G. Chiorboli, P. Cov...