21183 search results - page 489 / 4237 » Adaptive Testing by Test |
159
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STACS
2000
Springer
15 years 10 months ago
2000
Springer
We clarify the computational complexity of planarity testing, by showing that planarity testing is hard for L, and lies in SL. This nearly settles the question, since it is widely...
182
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DATE
2010
IEEE
15 years 9 months ago
2010
IEEE
Various X-filling methods have been proposed for reducing the shift and/or capture power in scan testing. The main drawback of these methods is that X-filling for low power leads t...
155
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ASPDAC
2005
ACM
15 years 8 months ago
2005
ACM
－ We propose a novel oscillation ring (OR) test architecture for testing interconnects in SoC. In addition to stuck-at and open faults, this scheme can detect delay faults and cr...
166
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DAC
2005
ACM
15 years 8 months ago
2005
ACM
The purpose of this paper is to present the required tools for the development, testing and verification of DSP software in Matlab. The paper motivates a DSP Simulator concept tha...
159
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ERSA
2007
15 years 8 months ago
2007
- Two fault isolation approaches based on Combinatorial Group Testing (CGT) are presented. Although they both share the basic principle of grouping suspect resources into subgroups...