21183 search results - page 487 / 4237 » Adaptive Testing by Test |
156
click to vote
ITC
1998
IEEE
15 years 11 months ago
1998
IEEE
Existing high-level BIST synthesis methods focus on one objective, minimizing either area overhead or test time. Hence, those methods do not render exploration of large design spa...
153
click to vote
LCPC
1998
Springer
15 years 11 months ago
1998
Springer
: In this paper, theoretical aspects to demonstrate the accuracy of the Interval Test (the I test and the direction vector I test) to be applied for resolving the problem stated ab...
145
click to vote
PVM
1998
Springer
15 years 11 months ago
1998
Springer
Abstract. Amongst its many features, MPI-2 offers the first standard highperformance I/O interface. While this enables a parallel and I/O intensive code to run on multiple platform...
142
click to vote
DAC
1996
ACM
15 years 11 months ago
1996
ACM
The testability of basic DSP datapath structures using pseudorandom built-in self-test techniques is examined. The addition of variance mismatched signals is identified as a testi...
193
click to vote
DAC
1996
ACM
15 years 11 months ago
1996
ACM
We propose a low-overhead scan design methodology which employs a new test point insertion technique to establish scan paths through the functional logic. The technique re-uses th...