A tool has been developed to automate the testing and grading of design projects implemented in reprogrammable hardware. The server allows multiple students to test circuits in FP...
Christopher K. Zuver, Christopher E. Neely, John W...
A unified approach to fault simulation for FGDs is introduced. Instead of a direct fault simulation, the proposed approach calculates indirectly from the simulator output the set...
Reachability analysis and simulation tools for high-level nets spend a significant amount of the computing time in performing enabling tests, determining the assignments under whi...
An area efficient and robust integrated test core for mixed-signal circuits is described. The core consists of a completely digital implementation, except for a simple reconstructi...
Mohamed Hafed, Nazmy Abaskharoun, Gordon W. Robert...
Functional scan chains are scan chains that have scan paths through a circuit's functional logic and flip-flops. Establishing functional scan paths by test point insertion (T...
Douglas Chang, Kwang-Ting Cheng, Malgorzata Marek-...