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167
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DFT
2003
IEEE
16 years 4 days ago
2003
IEEE
In this paper, we propose a new concept of testing only functionally testable transition faults in Broadside Transition testing via a novel constrained ATPG. For each functionally...
182
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ICCD
2003
IEEE
16 years 4 days ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
163
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ISCAS
2003
IEEE
16 years 4 days ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
156
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ITC
2003
IEEE
16 years 4 days ago
2003
IEEE
A delay-locked loop (DLL) based built-in self test (BIST) circuit has been designed with a 0.18 µ m TSMC process (CM018) to test chip I/O speeds, specifically, the setup and hold...
155
Voted
ITC
2003
IEEE
16 years 4 days ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...