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175
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DATE
2008
IEEE
16 years 1 months ago
2008
IEEE
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
169
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ICST
2008
IEEE
16 years 1 months ago
2008
IEEE
Evidence suggests that as software ages the original realizations of design patterns remain in place, and participants in design pattern realizations accumulate “grime” – no...
150
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IEEEARES
2008
IEEE
16 years 1 months ago
2008
IEEE
We consider a network of remote agent platforms that are tested by roaming spy agents in order to identify those that are malicious, based on the outcome of each agent. It is show...
139
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DDECS
2007
IEEE
16 years 1 months ago
2007
IEEE
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
197
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ETS
2007
IEEE
16 years 1 months ago
2007
IEEE
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...