21183 search results - page 467 / 4237 » Adaptive Testing by Test |
182
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CP
1998
Springer
15 years 11 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
158
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ATS
1996
IEEE
15 years 11 months ago
1996
IEEE
In this paper, we present a novel and efticient approach to test MCM at the module as well as chip levels. Our design incorporates the concept of the multifrequency test method an...
157
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ISSTA
1993
ACM
15 years 11 months ago
1993
ACM
Most of the effort that goes into improving the quality of software paradoxically does not lead to quantitative, measurable quality. Software developers and quality-assurance orga...
177
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ISAAC
1992
Springer
15 years 11 months ago
1992
Springer
A (0,1)-matrix satisfies the consecutive ones property if there exists a column permutation such that the ones in each row of the resulting matrix are consecutive. Booth and Lueke...
158
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ISSTA
2010
ACM
15 years 10 months ago
2010
ACM
The output of a disassembler is used for many different purposes (e.g., debugging and reverse engineering). Therefore, disassemblers represent the first link of a long chain of s...