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ETS
2006
IEEE
129views Hardware» more  ETS 2006»
16 years 27 days ago
Dynamic Voltage Scaling Aware Delay Fault Testing
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faul...
Noohul Basheer Zain Ali, Mark Zwolinski, Bashir M....
ACMDIS
2006
ACM
16 years 24 days ago
What do usability evaluators do in practice?: an explorative study of think-aloud testing
Think-aloud testing is a widely employed usability evaluation method, yet its use in practice is rarely studied. We report an explorative study of 14 think-aloud sessions, the aud...
Mie Nørgaard, Kasper Hornbæk
ASPDAC
2006
ACM
144views Hardware» more  ASPDAC 2006»
16 years 24 days ago
Compaction of pass/fail-based diagnostic test vectors for combinational and sequential circuits
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
Yoshinobu Higami, Kewal K. Saluja, Hiroshi Takahas...
ASWEC
2005
IEEE
16 years 14 days ago
A UML Approach to the Generation of Test Sequences for Java-Based Concurrent Systems
Starting with a UML specification that captures the underlying functionality of some given Java-based concurrent system, we describe a systematic way to construct, from this speci...
Soon-Kyeong Kim, Luke Wildman, Roger Duke
ECBS
2005
IEEE
160views Hardware» more  ECBS 2005»
16 years 13 days ago
Traceability-Driven Model Refinement for Test Case Generation
Testing complex Computer-Based Systems is not only a demanding but a very critical task. Therefore the use of models for generating test data is an important goal. Tool support du...
Matthias Riebisch, Michael Hübner