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ICMT
2009
Springer
16 years 1 months ago
Automatic Model Generation Strategies for Model Transformation Testing
Testing model transformations requires input models which are graphs of inter-connected objects that must conform to a meta-model and meta-constraints from heterogeneous sources su...
Sagar Sen, Benoit Baudry, Jean-Marie Mottu
KBSE
2008
IEEE
16 years 1 months ago
DiffGen: Automated Regression Unit-Test Generation
— Software programs continue to evolve throughout their lifetime. Maintenance of such evolving programs, including regression testing, is one of the most expensive activities in ...
Kunal Taneja, Tao Xie
CCGRID
2007
IEEE
16 years 1 months ago
Build-and-Test Workloads for Grid Middleware: Problem, Analysis, and Applications
The Grid promise is starting to materialize today: largescale multi-site infrastructures have grown to assist the work of scientists from all around the world. This tremendous gro...
Alexandru Iosup, Dick H. J. Epema
DATE
2007
IEEE
92views Hardware» more  DATE 2007»
16 years 1 months ago
Test quality analysis and improvement for an embedded asynchronous FIFO
Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clock...
Tobias Dubois, Erik Jan Marinissen, Mohamed Aziman...
ETS
2007
IEEE
94views Hardware» more  ETS 2007»
16 years 1 months ago
An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Therefore embedded memories are commonly equipped with spare r...
Philipp Öhler, Sybille Hellebrand, Hans-Joach...