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ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
16 years 3 months ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
STACS
2010
Springer
16 years 1 months ago
Quantum Algorithms for Testing Properties of Distributions
Abstract. Suppose one has access to oracles generating samples from two unknown probability distributions p and q on some N-element set. How many samples does one need to test whet...
Sergey Bravyi, Aram Wettroth Harrow, Avinatan Hass...
TACAS
2009
Springer
122views Algorithms» more  TACAS 2009»
16 years 1 months ago
Test Input Generation for Programs with Pointers
Software testing is an essential process to improve software quality in practice. Researchers have proposed several techniques to automate parts of this process. In particular, sym...
Dries Vanoverberghe, Nikolai Tillmann, Frank Piess...
CEC
2009
IEEE
16 years 1 months ago
Constructing test problems for bilevel evolutionary multi-objective optimization
— Many real-world problems demand a feasible solution to satisfy physical equilibrium, stability, or certain properties which require an additional lower level optimization probl...
Kalyanmoy Deb, Ankur Sinha
CSO
2009
IEEE
16 years 1 months ago
Association Rules Based Data Mining on Test Data of Physical Health Standard
With the development of modern electronic and computer technologies, sports training and competition became more and more technical. A great deal of data were recorded, including ...
Lan Yu