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ORL
2008
82views more  ORL 2008»
15 years 6 months ago
On test sets for nonlinear integer maximization
A finite test set for an integer optimization problem enables us to verify whether a feasible point attains the global optimum. We establish in this paper several general results ...
Jon Lee, Shmuel Onn, Robert Weismantel
ORL
2006
103views more  ORL 2006»
15 years 6 months ago
Reduction tests for the prize-collecting Steiner problem
This article introduces a proper redefinition of the concept of bottleneck Steiner distance for the Prize-Collecting Steiner Problem. This allows the application of reduction test...
Eduardo Uchoa
178
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TAP
2008
Springer
93views Hardware» more  TAP 2008»
15 years 6 months ago
Pex-White Box Test Generation for .NET
Pex automatically produces a small test suite with high code coverage for a .NET program. To this end, Pex performs a systematic program analysis (using dynamic symbolic execution,...
Nikolai Tillmann, Jonathan de Halleux
ET
2002
77views more  ET 2002»
15 years 6 months ago
Reusing Scan Chains for Test Pattern Decompression
The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...
Rainer Dorsch, Hans-Joachim Wunderlich
STVR
2002
80views more  STVR 2002»
15 years 6 months ago
Conditioned slicing supports partition testing
This paper describes the use of conditioned slicing to assist partition testing, illustrating this with a case study. The paper shows how a conditioned slicing tool can be used to...
Robert M. Hierons, Mark Harman, Chris Fox, Lahcen ...