21183 search results - page 453 / 4237 » Adaptive Testing by Test |
210
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IOLTS
2005
IEEE
16 years 12 days ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
157
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AGILEDC
2003
IEEE
16 years 3 days ago
2003
IEEE
The scientific method serves as a good metaphor for several practices in Extreme Programming (XP). We explore the commonalities and differences and show that the scientific method...
173
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COCO
2001
Springer
15 years 11 months ago
2001
Springer
We give a simple analysis of the PCP with low amortized query complexity of Samorodnitsky and Trevisan [16]. The analysis also applies to the linearity testing over finite field...
215
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PKC
2001
Springer
15 years 11 months ago
2001
Springer
Abstract. We describe a new general method to perform part of the setup stage of the XTR system introduced at Crypto 2000, namely finding the trace of a generator of the XTR group...
178
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IOLTS
2000
IEEE
15 years 11 months ago
2000
IEEE
We propose a procedure for self-testing of an FPGA programmed to implement a user-defined function. The procedure is intended to improve the detectability of FPGA delay faults. Th...